TY  - RPRT
TI  - Temperature overshoot as the cause of physical changes in resistive switching devices during electro-formation
AU  - Jingjia Meng
AU  - Bingyuan Zhao
AU  - Jonathan M. Goodwill
AU  - James A. Bain
AU  - Marek Skowronski
PY  - 2020
DO  - 10.1063/5.0010882
UR  - https://arxiv.org/abs/2004.06571
ID  - 2004.06571
ER  -