TY  - RPRT
TI  - Screw dislocation that converts p-type GaN to n-type: Microscopic study on the Mg condensation and the leakage current in p-n diodes
AU  - Takashi Nakano
AU  - Yosuke Harashima
AU  - Kenta Chokawa
AU  - Kenji Shiraishi
AU  - Atsushi Oshiyama
AU  - Yoshihiro Kangawa
AU  - Shigeyoshi Usami
AU  - Norihito Mayama
AU  - Kazuya Toda
AU  - Atsushi Tanaka
AU  - Yoshio Honda
AU  - Hiroshi Amano
PY  - 2020
DO  - 10.1063/5.0010664
UR  - https://arxiv.org/abs/2004.06876
ID  - 2004.06876
ER  -