@misc{indiciae4bbb8a28424f,
  title = {Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity},
  author = {Jan Krieft and Dominik Graulich and Anastasiia Moskaltsova and Laurence Bouchenoire and Sonia Francoual and Timo Kuschel},
  year = {2020},
  doi = {10.1088/1361-6463/ab8fdc},
  url = {https://arxiv.org/abs/2004.08215},
  note = {Source identifier: 2004.08215}
}