TY  - RPRT
TI  - Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity
AU  - Jan Krieft
AU  - Dominik Graulich
AU  - Anastasiia Moskaltsova
AU  - Laurence Bouchenoire
AU  - Sonia Francoual
AU  - Timo Kuschel
PY  - 2020
DO  - 10.1088/1361-6463/ab8fdc
UR  - https://arxiv.org/abs/2004.08215
ID  - 2004.08215
ER  -