TY  - RPRT
TI  - Electromigration-guided composition patterns in thin alloy films: a computational study
AU  - Mikhail Khenner
PY  - 2020
DO  - 10.1016/j.susc.2020.121611
UR  - https://arxiv.org/abs/2004.08314
ID  - 2004.08314
ER  -