@misc{indiciaeaece71059b70,
  title = {Three-layer Approach to Detect Anomalies in Industrial Environments based on Machine Learning},
  author = {Daniel Gutierrez-Rojas and Mehar Ullah and Ioannis T. Christou and Gustavo Almeida and Pedro H. J. Nardelli and Dick Carrillo and Jean M. Sant'Ana and Hirley Alves and Merim Dzaferagic and Alessandro Chiumento and Charalampos Kalalas},
  year = {2020},
  url = {https://arxiv.org/abs/2004.09097},
  note = {Source identifier: 2004.09097}
}