TY  - RPRT
TI  - Three-layer Approach to Detect Anomalies in Industrial Environments based on Machine Learning
AU  - Daniel Gutierrez-Rojas
AU  - Mehar Ullah
AU  - Ioannis T. Christou
AU  - Gustavo Almeida
AU  - Pedro H. J. Nardelli
AU  - Dick Carrillo
AU  - Jean M. Sant'Ana
AU  - Hirley Alves
AU  - Merim Dzaferagic
AU  - Alessandro Chiumento
AU  - Charalampos Kalalas
PY  - 2020
UR  - https://arxiv.org/abs/2004.09097
ID  - 2004.09097
ER  -