TY  - RPRT
TI  - Ionization Yield in Silicon for eV-Scale Electron-Recoil Processes
AU  - Karthik Ramanathan
AU  - Noah Kurinsky
PY  - 2020
DO  - 10.1103/physrevd.102.063026
UR  - https://arxiv.org/abs/2004.10709
ID  - 2004.10709
ER  -