@misc{indiciaee754252bf909,
  title = {X-ray phase contrast topography to measure the surface stress and bulk strain in a silicon crystal},
  author = {Enrico Massa and Carlo Paolo Sasso and Matteo Fretto and Luca Martino and Giovanni Mana},
  year = {2020},
  doi = {10.1107/s1600576720009267},
  url = {https://arxiv.org/abs/2004.11275},
  note = {Source identifier: 2004.11275}
}