TY  - RPRT
TI  - X-ray phase contrast topography to measure the surface stress and bulk strain in a silicon crystal
AU  - Enrico Massa
AU  - Carlo Paolo Sasso
AU  - Matteo Fretto
AU  - Luca Martino
AU  - Giovanni Mana
PY  - 2020
DO  - 10.1107/s1600576720009267
UR  - https://arxiv.org/abs/2004.11275
ID  - 2004.11275
ER  -