TY  - RPRT
TI  - Power divergence approach for one-shot device testing under competing risks
AU  - N. Balakrishnan
AU  - E. Castilla
AU  - N. Martin
AU  - L. Pardo
PY  - 2020
UR  - https://arxiv.org/abs/2004.13372
ID  - 2004.13372
ER  -