@misc{indiciaeef7d64b37084,
  title = {Raman spectroscopy of ion irradiated SiC: chemical defects, strain, annealing, and oxidation},
  author = {Alexander J. Leide and Matthew J. Lloyd and Richard I. Todd and David E. J. Armstrong},
  year = {2020},
  url = {https://arxiv.org/abs/2004.14335},
  note = {Source identifier: 2004.14335}
}