TY  - RPRT
TI  - Raman spectroscopy of ion irradiated SiC: chemical defects, strain, annealing, and oxidation
AU  - Alexander J. Leide
AU  - Matthew J. Lloyd
AU  - Richard I. Todd
AU  - David E. J. Armstrong
PY  - 2020
UR  - https://arxiv.org/abs/2004.14335
ID  - 2004.14335
ER  -