@misc{indiciae6bbb6eacca4d,
  title = {Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties},
  author = {Alexander J. Leide and Richard I. Todd and David E. J. Armstrong},
  year = {2020},
  doi = {10.1016/j.actamat.2020.06.030},
  url = {https://arxiv.org/abs/2004.14688},
  note = {Source identifier: 2004.14688}
}