TY  - RPRT
TI  - Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties
AU  - Alexander J. Leide
AU  - Richard I. Todd
AU  - David E. J. Armstrong
PY  - 2020
DO  - 10.1016/j.actamat.2020.06.030
UR  - https://arxiv.org/abs/2004.14688
ID  - 2004.14688
ER  -