TY  - RPRT
TI  - Identification of two trapping mechanisms responsible of the threshold voltage variation in SiO$_2$/4H-SiC MOSFETs
AU  - Patrick Fiorenza
AU  - Filippo Giannazzo
AU  - Mario Saggio
AU  - Fabrizio Roccaforte
PY  - 2020
DO  - 10.1063/5.0012399
UR  - https://arxiv.org/abs/2004.14925
ID  - 2004.14925
ER  -