TY  - RPRT
TI  - Line and surface defects for the free scalar field
AU  - Edoardo Lauria
AU  - Pedro Liendo
AU  - Balt C. van Rees
AU  - Xiang Zhao
PY  - 2020
DO  - 10.1007/jhep01(2021)060
UR  - https://arxiv.org/abs/2005.02413
ID  - 2005.02413
ER  -