@misc{indiciae13549af39634, title = {Computer Vision Toolkit for Non-invasive Monitoring of Factory Floor Artifacts}, author = {Aditya M. Deshpande and Anil Kumar Telikicherla and Vinay Jakkali and David A. Wickelhaus and Manish Kumar and Sam Anand}, year = {2020}, doi = {10.1016/j.promfg.2020.05.141}, url = {https://arxiv.org/abs/2005.06037}, note = {Source identifier: 2005.06037} }