@misc{indiciae01bb931e9374,
  title = {Characterisation of negative-U defects in semiconductors},
  author = {José Coutinho and Vladimir P. Markevich and Anthony R. Peaker},
  year = {2020},
  doi = {10.1088/1361-648x/ab8091},
  url = {https://arxiv.org/abs/2005.06447},
  note = {Source identifier: 2005.06447}
}