TY  - RPRT
TI  - Characterisation of negative-U defects in semiconductors
AU  - José Coutinho
AU  - Vladimir P. Markevich
AU  - Anthony R. Peaker
PY  - 2020
DO  - 10.1088/1361-648x/ab8091
UR  - https://arxiv.org/abs/2005.06447
ID  - 2005.06447
ER  -