@misc{indiciaee01ed8dacb2f,
  title = {Intermittently Failing Tests in the Embedded Systems Domain},
  author = {Per Erik Strandberg and Thomas J Ostrand and Elaine J Weyuker and Wasif Afzal and Daniel Sundmark},
  year = {2020},
  url = {https://arxiv.org/abs/2005.06826},
  note = {Source identifier: 2005.06826}
}