@misc{indiciae1a6ef2d48f8d,
  title = {An Instrument for Precision Controlled Radiation Exposures, Charged Beam Profile Measurement, and Real-time Fluence Monitoring Beyond \$10\textasciicircum{}\{16\}\$ n\$\_\{\textbackslash{}textrm\{eq\}\}\$/cm\$\textasciicircum{}\{2\}\$},
  author = {M. R. Hoeferkamp and J. S. T. Wickramasinghe and A. Grummer and I. Rajen and S. Seidel},
  year = {2020},
  doi = {10.1088/1748-0221/15/05/p05024},
  url = {https://arxiv.org/abs/2005.06908},
  note = {Source identifier: 2005.06908}
}