TY  - RPRT
TI  - An Instrument for Precision Controlled Radiation Exposures, Charged Beam Profile Measurement, and Real-time Fluence Monitoring Beyond $10^{16}$ n$_{\textrm{eq}}$/cm$^{2}$
AU  - M. R. Hoeferkamp
AU  - J. S. T. Wickramasinghe
AU  - A. Grummer
AU  - I. Rajen
AU  - S. Seidel
PY  - 2020
DO  - 10.1088/1748-0221/15/05/p05024
UR  - https://arxiv.org/abs/2005.06908
ID  - 2005.06908
ER  -