TY  - RPRT
TI  - Multi-Fidelity Gaussian Process based Empirical Potential Development for Si:H Nanowires
AU  - Moonseop Kim
AU  - Huayi Yin
AU  - Guang Lin
PY  - 2020
UR  - https://arxiv.org/abs/2005.08638
ID  - 2005.08638
ER  -