@misc{indiciaec624091e4f3f,
  title = {Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detector},
  author = {K. Nakazawa and K. Mitsuishi and K. Shibata and S. Amma and T. Mizoguchi},
  year = {2020},
  url = {https://arxiv.org/abs/2005.09337},
  note = {Source identifier: 2005.09337}
}