@misc{indiciae27bb8dff043b,
  title = {Determining the refractive index, absolute thickness and local slope of a thin transparent film using multi-wavelength and multi-incident-angle interference},
  author = {Mengfei He and Sidney R. Nagel},
  year = {2020},
  doi = {10.1364/oe.397736},
  url = {https://arxiv.org/abs/2005.10437},
  note = {Source identifier: 2005.10437}
}