TY  - RPRT
TI  - Determining the refractive index, absolute thickness and local slope of a thin transparent film using multi-wavelength and multi-incident-angle interference
AU  - Mengfei He
AU  - Sidney R. Nagel
PY  - 2020
DO  - 10.1364/oe.397736
UR  - https://arxiv.org/abs/2005.10437
ID  - 2005.10437
ER  -