@misc{indiciae204720e61571,
  title = {Phase retrieval by pattern classification and circular mean for robust optical testing},
  author = {Ohgan Kim and Bong Ju Lee and Yun-Woo Lee and Ho-Soon Yang},
  year = {2020},
  url = {https://arxiv.org/abs/2005.10997},
  note = {Source identifier: 2005.10997}
}