TY  - RPRT
TI  - Phase retrieval by pattern classification and circular mean for robust optical testing
AU  - Ohgan Kim
AU  - Bong Ju Lee
AU  - Yun-Woo Lee
AU  - Ho-Soon Yang
PY  - 2020
UR  - https://arxiv.org/abs/2005.10997
ID  - 2005.10997
ER  -