@misc{indiciaefb9a640c9c2a,
  title = {Deep learning method to remove chemical, kinetic and electric artifacts on ISEs},
  author = {Byunghyun Ban},
  year = {2020},
  doi = {10.1109/ictc49870.2020.9289083},
  url = {https://arxiv.org/abs/2005.13400},
  note = {Source identifier: 2005.13400}
}