TY  - RPRT
TI  - Highly Accurate Determination of Heterogeneously Stacked Van-der-Waals Materials by Optical Microspectroscopy
AU  - Andreas Hutzler
AU  - Birk Fritsch
AU  - Christian D. Matthus
AU  - Michael P. M. Jank
AU  - Mathias Rommel
PY  - 2020
DO  - 10.1038/s41598-020-70580-3
UR  - https://arxiv.org/abs/2005.13859
ID  - 2005.13859
ER  -