@misc{indiciae947ce7bb8b05,
  title = {Contact resistance extraction of graphene FET technologies based on individual device characterization},
  author = {Anibal Pacheco-Sanchez and Pedro C. Feijoo and David Jiménez},
  year = {2020},
  doi = {10.1016/j.sse.2020.107882},
  url = {https://arxiv.org/abs/2005.13926},
  note = {Source identifier: 2005.13926}
}