TY  - RPRT
TI  - Contact resistance extraction of graphene FET technologies based on individual device characterization
AU  - Anibal Pacheco-Sanchez
AU  - Pedro C. Feijoo
AU  - David Jiménez
PY  - 2020
DO  - 10.1016/j.sse.2020.107882
UR  - https://arxiv.org/abs/2005.13926
ID  - 2005.13926
ER  -