@misc{indiciaedced0eb73e2c,
  title = {A ray-trace analysis of X-ray multilayer Laue lenses for nanometer focusing},
  author = {Henry N. Chapman and Saša Bajt},
  year = {2020},
  doi = {10.1088/2040-8986/abb9c2},
  url = {https://arxiv.org/abs/2006.00297},
  note = {Source identifier: 2006.00297}
}