TY  - RPRT
TI  - A ray-trace analysis of X-ray multilayer Laue lenses for nanometer focusing
AU  - Henry N. Chapman
AU  - Saša Bajt
PY  - 2020
DO  - 10.1088/2040-8986/abb9c2
UR  - https://arxiv.org/abs/2006.00297
ID  - 2006.00297
ER  -