TY  - RPRT
TI  - Accuracy of Y-function methods for parameters extraction of two-dimensional FETs across different technologies
AU  - Anibal Pacheco-Sanchez
AU  - David Jiménez
PY  - 2020
DO  - 10.1049/el.2020.1502
UR  - https://arxiv.org/abs/2006.03035
ID  - 2006.03035
ER  -