@misc{indiciae4d10efc166e8,
  title = {Spectroscopic thickness and quality metrics for PtSe\$\_2\$ layers produced by top-down and bottom-up techniques},
  author = {Beata M. Szydłowska and Oliver Hartwig and Bartlomiej Tywoniuk and Tomáš Hartman and Tanja Stimpel-Lindner and Zdeněk Sofer and Niall McEvoy and Georg S. Duesberg and Claudia Backes},
  year = {2020},
  url = {https://arxiv.org/abs/2006.04165},
  note = {Source identifier: 2006.04165}
}