TY  - RPRT
TI  - General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers
AU  - Ari-Pekka Honkanen
AU  - Simo Huotari
PY  - 2020
UR  - https://arxiv.org/abs/2006.04952
ID  - 2006.04952
ER  -