TY  - RPRT
TI  - A system to test 2D optoelectronic devices in high vacuum
AU  - Qinghua Zhao
AU  - Felix Carrascoso
AU  - Patricia Gant
AU  - Tao Wang
AU  - Riccardo Frisenda
AU  - Andres Castellanos-Gomez
PY  - 2020
DO  - 10.1088/2515-7639/ab8781
UR  - https://arxiv.org/abs/2006.06714
ID  - 2006.06714
ER  -