@misc{indiciae3db8c5dcf30f,
  title = {Contamination of TEM Holders Quantified and Mitigated with Open-Hardware, High-Vacuum Bakeout System},
  author = {Yin Min Goh and Jonathan Schwartz and Emily Rennich and Tao Ma and Bobby Kerns and Robert Hovden},
  year = {2020},
  doi = {10.1017/s1431927620001762},
  url = {https://arxiv.org/abs/2006.09343},
  note = {Source identifier: 2006.09343}
}