@misc{indiciae88a3820ecdcf,
  title = {On the key role of oxygen vacancies electromigration in the memristive response of ferroelectric devices},
  author = {C. Ferreyra and M. Rengifo and M. J. Sánchez and A. S. Everhard and B. Noheda and D. Rubi},
  year = {2020},
  doi = {10.1103/physrevapplied.14.044045},
  url = {https://arxiv.org/abs/2006.10891},
  note = {Source identifier: 2006.10891}
}