TY  - RPRT
TI  - On the key role of oxygen vacancies electromigration in the memristive response of ferroelectric devices
AU  - C. Ferreyra
AU  - M. Rengifo
AU  - M. J. Sánchez
AU  - A. S. Everhard
AU  - B. Noheda
AU  - D. Rubi
PY  - 2020
DO  - 10.1103/physrevapplied.14.044045
UR  - https://arxiv.org/abs/2006.10891
ID  - 2006.10891
ER  -