@misc{indiciaefdb0b9f5f08f,
  title = {Conductive filament evolution dynamics revealed by cryogenic (1.5 K) multilevel switching of CMOS-compatible Al2O3/TiO2 resistive memories},
  author = {Yann Beilliard and François Paquette and Frédéric Brousseau and Serge Ecoffey and Fabien Alibart and Dominique Drouin},
  year = {2020},
  doi = {10.1088/1361-6528/aba6b4},
  url = {https://arxiv.org/abs/2006.13394},
  note = {Source identifier: 2006.13394}
}