TY  - RPRT
TI  - Experimental observation and modeling of the impact of traps on static and analog/HF performance of graphene transistors
AU  - Anibal Pacheco-Sanchez
AU  - Nikolaos Mavredakis
AU  - Pedro C. Feijoo
AU  - Wei Wei
AU  - Emiliano Pallecchi
AU  - Henri Happy
AU  - David Jiménez
PY  - 2020
DO  - 10.1109/ted.2020.3029542
UR  - https://arxiv.org/abs/2006.15889
ID  - 2006.15889
ER  -