@misc{indiciaed8685731a5b7,
  title = {Temperature Accelerated Life Test and Failure Analysis on Upright Metamorphic Ga0.37In0.63P/Ga0.83In0.17As/Ge Triple Junction Solar Cells},
  author = {Vincenzo Orlando and Iván Lombardero and Mercedes Gabás and Neftali Nuñez and Manuel Vázquez and Pilar Espinet-González and Jesús Bautista and Rocio Romero and Carlos Algora},
  year = {2020},
  doi = {10.1002/pip.3223},
  url = {https://arxiv.org/abs/2006.16665},
  note = {Source identifier: 2006.16665}
}