TY  - RPRT
TI  - Temperature Accelerated Life Test and Failure Analysis on Upright Metamorphic Ga0.37In0.63P/Ga0.83In0.17As/Ge Triple Junction Solar Cells
AU  - Vincenzo Orlando
AU  - Iván Lombardero
AU  - Mercedes Gabás
AU  - Neftali Nuñez
AU  - Manuel Vázquez
AU  - Pilar Espinet-González
AU  - Jesús Bautista
AU  - Rocio Romero
AU  - Carlos Algora
PY  - 2020
DO  - 10.1002/pip.3223
UR  - https://arxiv.org/abs/2006.16665
ID  - 2006.16665
ER  -