TY  - RPRT
TI  - Electrothermal Transport Induced Material Re Configuration and Performance Degradation of CVD Grown Monolayer MoS2 Transistors
AU  - Ansh
AU  - Jeevesh Kumar
AU  - Gaurav Sheoran
AU  - Mayank Shrivastava
PY  - 2020
UR  - https://arxiv.org/abs/2006.16952
ID  - 2006.16952
ER  -