@misc{indiciae9fff0eb1fd33,
  title = {Detecting Band Profiles of Devices with Conductive Atomic Force Microscopy},
  author = {Ranran Li and Takashi Taniguchi and Kenji Watanabe and Jiamin Xue},
  year = {2020},
  url = {https://arxiv.org/abs/2007.04502},
  note = {Source identifier: 2007.04502}
}