TY  - RPRT
TI  - Capping and gate control of anomalous Hall effect and hump structure in ultra-thin SrRuO$_3$ films
AU  - Donghan Kim
AU  - Byungmin Sohn
AU  - Minsoo Kim
AU  - Sungsoo Hahn
AU  - Youngdo Kim
AU  - Jong Hyuk Kim
AU  - Young Jai Choi
AU  - Changyoung Kim
PY  - 2021
DO  - 10.1063/5.0050163
UR  - https://arxiv.org/abs/2007.09872
ID  - 2007.09872
ER  -