TY  - RPRT
TI  - Evaluation of Radiation Hardness of High-Voltage Silicon Vertical JFETs
AU  - Gabriele Giacomini
AU  - Marco Bomben
AU  - Wei Chen
AU  - David Lynn
PY  - 2020
DO  - 10.1088/1748-0221/15/11/t11001
UR  - https://arxiv.org/abs/2007.10892
ID  - 2007.10892
ER  -